1 Jul
2015
1 Jul
'15
5:48 p.m.
On Wed, Jul 1, 2015 at 5:39 PM, Patrik D'haeseleer <patrikd(a)gmail.com> wrote:
DOH! Thank Nathan - that would be a huge difference. I
got fooled by the
fact that the several listings on caeonline.com all call it a FIB SEM
system:
http://www.caeonline.com/listing/product/9095358/seiko-smi-3200
http://www.caeonline.com/listing/product/67711/seiko-smi-3200
http://www.caeonline.com/listing/product/9025735/seiko-smi-3200
Don't these things usually allow some secondary electron imaging as well
though?
Yes, the imaging electronics is the same as a scanning electron
microscope, the beam scan electronics probably a bit different but
mostly the same ideas (using electrical or magnetic fields to scan the
beam).
If it doesn't have any imaging capabilities, I doubt that we would want this
beast. Would be good to check this with the owner though...
Yep, I'm guessing this has imaging... it would be pretty hard to focus
to <5nm without some feedback to check edges for!